Searched for: subject%3A%22Atomic%255C+Force%22
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van der Maarel, Stefan (author)
High-Speed Atomic Force Microscopy is widely used for investigating biological architectures and the semiconductor industry. The main limitation comes from parachuting or the Wile E. Coyote effect. Parachuting is the phenomenon where the cantilever taps on the sample towards a steep decrease in height, but does not get adjusted for this decrease...
master thesis 2022
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PRASAD, ROSHAN (author)
Graphene is considered a promising material due to its unique electrical characteristics and excellent mechanical properties. These extraordinary properties make graphene a suitable material for applications like mechanical reinforcements, protective coatings, supercapacitors, sensors, etc. However, when trying to extract these properties...
master thesis 2022
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Popa, Bogdan (author)
Objectives: With an increasing life expectancy in the western societies and more people practising extreme sports, the demand for orthopaedic implants is set to increase. Orthopaedic implant loosening is one of the main causes of revision surgeries, leading to increases in the costs of patient care and patient dissatisfaction. Better...
master thesis 2020
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Penning, Casper (author)
Viscoelasticity is a material property that is relevant in a variety of nanoscale materials and interfaces in medicine and industry. Therefore, a method of mechanical quantification has become exceedingly desired. In this thesis the Atomic force microscope (AFM) is applied to accurately characterize the mechanical behavior of viscoelastic...
master thesis 2020
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James, Matthew (author)
Dynamic Atomic Force Microscopy (dAFM) is an extremely powerful tool for exploring surface topology and nanoscale manipulation and characterization. A feature of dAFM is the existence of highly nonlinear forces between a cantilever tip and sample. One of these forces that plays a large role in operation of AFM is the van der Waals (vdW) force....
master thesis 2019
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Noom, Jacques (author)
Currently used imaging methods in Atomic Force Microscopy (AFM) including the use of a Lock-In Amplifier or a Phase-Locked Loop, are suboptimal. In this report, the image resolution in AFM is improved by detecting the tip-sample interaction using complete measurements of the input of the cantilever and its measured deflection. Two methods are...
master thesis 2019
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Fuchs, Dominique (author)
Aseptic loosening is a major cause of revision surgery in total hip arthroplasties. To slow down, or reverse loosening, tissue engineering interventions could provide solutions. One possible solution is collagen crosslinking, increasing the stiffness of the tissue. This research is a first investigation into UV-induced crosslinking on tissue...
master thesis 2018
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van den Brink, Bram (author)
To facilitate research on the dynamics of micro-cantilevers immersed in liquid, a modal test setup was designed. Modal testing is a powerful form of dynamic testing whereby the system's natural frequencies, modal masses, modal damping ratios, mode shapes, and weight of each of these modes at a certain frequency are determined. Micro-cantilever...
master thesis 2017
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Gribnau, Thomas (author)
Since its invention, the Atomic Force Microscope has emerged into one of the most useful tools in<br/>nanotechnology due to its acclaimed abilities in exploring surface topography, micro- and nanoscale manipulation<br/>and characterization. The nonlinear interaction between the cantilever tip and the sample surface<br/>has been studied in great...
master thesis 2017
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Rajagopal, Sricharan (author)
<br/>In recent years the Tapping Mode-Atomic Force Microscope (TM-AFM) has become one of the most important tools for imaging on the nanometer scale. In comparison with other contemporary technologies, the AFMs have been able to obtain atomic resolution both in high vacuum and liquid environments thus affirming their supremacy. The AFM can be...
master thesis 2017
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Obrebski, J.W. (author)
This abstract presents the development of an Atomic Force Microscope (AFM) vertical scanner for surface topography measurements, which is composed of a single axis positioning stage with an integrated metrology system and AFM probe. The scanner is meant to track and measure a maximum topography step of 10 ?m with a measurement resolution of less...
master thesis 2010
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