Searched for: subject%3A%22microscopy%22
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document
LeRoy, B.J. (author), Lemay, S.G. (author), Kong, J. (author), Dekker, C. (author)
We have performed low-temperature scanning tunneling microscopy measurements on single-wall carbon nanotubes that are freely suspended over a trench. The nanotubes were grown by chemical vapor deposition on a Pt substrate with predefined trenches etched into it. Atomic resolution was obtained on the freestanding portions of the nanotubes....
journal article 2004
document
Smit, G.D.J. (author), Rogge, S. (author), Klapwijk, T.M. (author)
We have measured electrical transport across epitaxial, nanometer-sized metal–semiconductor interfaces by contacting CoSi2 islands grown on Si(111) with the tip of a scanning tunneling microscope. The conductance per unit area was found to increase with decreasing diode area. Indeed, the zero-bias conductance was found to be ? 104 times larger...
journal article 2002
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Venema, L.C. (author), Wildoer, J.W.G. (author), Tuinstra, H.L.J.T. (author), Dekker, C. (author), Rinzler, A.G. (author), Smalley, R.E. (author)
journal article 1997
document
Dekker, C. (author), Tans, S.J. (author), Oberndorff, B. (author), Meyer, R. (author), Venema, L.C. (author)
journal article 1997
Searched for: subject%3A%22microscopy%22
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