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1 Dependence of the degree of paraxiality on field correlations
Article/Letter to the Editor Applied Sciences     2008-08-08    
Author: El Gawhary, O. · Severini, S.
Keywords: laser beam shaping · propagation
[PDF] [Abstract]

2 On the nonparaxial corrections of Bessel–Gauss beams
Article/Letter to the Editor Applied Sciences     2010-02-23    
Author: El Gawhary, O. · Severini, S.
Keywords: modes · diffraction theory · propagation
[PDF] [Abstract]

3 Performance analysis of coherent optical scatterometry
Article/Letter to the Editor Applied Sciences     2011-11-12    
Author: El Gawhary, O. · Kumar, N. · Pereira, S.F. · Coene, W.M.J. · Urbach, H.P.
[PDF] [Abstract]

4 Coherent transient phenomena in quantum systems by spatially shaping femtosecond optical pulses
Article/Letter to the Editor Applied Sciences     2011-03-16    
Author: El Gawhary, O. · Pereira, S.F. · Urbach, H.P.
[PDF] [Abstract]

5 Method and apparatus for determining structure parameters of microstructures
Patent Applied Sciences     2012-09-27    
Author: El Gawhary, O. · Stefan, P.
[PDF] [Abstract]

6 Through-focus phase retrieval and its connection to the spatial correlation for propagating fields
Article/Letter to the Editor Applied Sciences     2013-02-27    
Author: El Gawhary, O. · Wiegmann, A. · Kumar, N. · Pereira, S.F. · Urbach, H.P.
[PDF] [Abstract]

7 Scaling symmetry and conserved charge for shape-invariant optical fields
Article/Letter to the Editor Applied Sciences     2013-02-13    
Author: El Gawhary, O. · Severini, S.
[PDF] [Abstract]

8 Nonexistence of pure S- and P-polarized surface waves at the interface between a perfect dielectric and a real metal
Article/Letter to the Editor Applied Sciences     2014-02-19    
Author: El Gawhary, O. · Adam, A.J.L. · Urbach, H.P.
[PDF] [Abstract]

9 Joint Research on Scatterometry and AFM Wafer Metrology
Article in monograph or in proceedings Applied Sciences     2011-05-23    
Author: Bodermann, B. · Buhr, E. · Danzebrink, H.U. · Bär, M. · Scholze, F. · Krumrey, M. · Wurm, M. · Klapetek, P. · Hansen, P.E. · Korpelainen, V. · Van Veghel, M. · Yacoot, A. · Siitonen, S. · El Gawhary, O. · Burger, S. · Saastamoinen, T.
Keywords: scatterometry · CD metrology · AFM · reference standard · rigorous modelling · inverse diffraction problem
[PDF] [Abstract]

10 Restoration of s-polarized evanescent waves and subwavelength imaging by a single dielectric slab
Article/Letter to the Editor Applied Sciences     2012-05-18    
Author: El Gawhary, O. · Schilder, N.J. · Da Costa Assafrao, A. · Pereira, S.F. · Urbach, H.P.
[PDF] [Abstract]

Search results also available in MS Excel format.

Showing 1 to 10 of 10 found. | Sort by date