An acceptance test for thermography of semi-transparent materials by a FLIR ThermaCAM SC3000 infrared camera with 8.0 µm low-wavelength-pass filter has been developed and performed on polycarbonate, PEN, quartz, Corning 1737 glass, G427 cone glas, G443 screen glass, Schott Zerodur, silicon and a black-body on a hotplate. Effective emis-sivities have been calculated from reflectivity spectra measurements of these materials.
The temperature measurement accuracy with 8.0 µm low-wavelength-pass filter is ±6 K, whereas the acceptance criterion of ±2 K is easily met by the old Agema 470 camera. Temperature non-uniformity is up to 5 K. The 8.0 µm low-wavelength-pass filter suppresses reflections of glass and polymer surfaces due to molecular stretching vibrations well. Temperature measurements with 8.0 µm low-wavelength-pass filter are fortunately insensitive to practical mechanical stresses and to lead evaporation of lead glass. Parasitic reflections of the crycooled detector and of the hot camera housing impede display inspection and the location of shorts wit hout filter. FLIR ThermaCAM Researcher software has a couple of bugs. Saving and reopening even corrupts the analysis.