Print Email Facebook Twitter Non-intrusive Near-field Characterization of Microwave Circuits and Devices Title Non-intrusive Near-field Characterization of Microwave Circuits and Devices Author Hou, R. (TU Delft Electronics) Contributor de Vreede, L.C.N. (promotor) Spirito, M. (copromotor) Degree granting institution Delft University of Technology Date 2017-01-24 To reference this document use: https://doi.org/10.4233/uuid:b6866d16-9a29-4fac-9f73-42a5ad26fc0f ISBN 978-94-6295-592-9 Part of collection Institutional Repository Document type doctoral thesis Rights © 2017 R. Hou Files PDF thesis170202.pdf 26.07 MB Close viewer /islandora/object/uuid%3Ab6866d16-9a29-4fac-9f73-42a5ad26fc0f/datastream/OBJ/view