Cryogenic Comparator Characterization and Modeling for a Cryo-CMOS 7b 1-GSa/s SAR ADC

Cryogenic Comparator Characterization and Modeling for a Cryo-CMOS 7b 1-GSa/s SAR ADC

Kiene, G. (TU Delft QCD/Sebastiano Lab; TU Delft QuTech Advanced Research Centre)
GUNAPUTI SREENIVASULU, A.M. (TU Delft Electrical Engineering, Mathematics and Computer Science; TU Delft QuTech Advanced Research Centre)
Overwater, R.W.J. (TU Delft QCD/Sebastiano Lab; TU Delft QuTech Advanced Research Centre)
Babaie, M. (TU Delft Electronics; TU Delft QuTech Advanced Research Centre)
Sebastiano, F. (TU Delft Quantum Circuit Architectures and Technology; TU Delft QuTech Advanced Research Centre)

Electrical Engineering, Mathematics and Computer Science

2022

This paper reports the experimental characterization and modelling of a stand-Alone StrongARM comparator at both room temperature (RT) and cryogenic temperature (4.2 K). The observed 6-dB improvement in the comparator input noise at 4.2 K is attributed to the reduction of the thermal noise and to the suppressed shot noise in the MOS transistors becoming dominant at cryogenic temperature. The proposed model is employed in the design of a loop-unrolled 2\times time-interleaved 1-GSa/s 7b SAR ADC for spin-qubit readout. As predicted by the comparator model, the ADC is noise-limited at RT to a SNDR of 38.2 dB at Nyquist input, while this improves to 41.1 dB at 4.2 K, now limited by distortion, thus resulting in the state-of-The-Art FoMw for cryo-CMOS ADC of 20.9 fJ/conv-step.

ADC
Cryo-CMOS
latching comparator
noise measurement
SAR
strongARM

http://resolver.tudelft.nl/uuid:1815d450-4131-4d59-b9ea-454da9225be1

https://doi.org/10.1109/ESSCIRC55480.2022.9911474

Institute of Electrical and Electronics Engineers (IEEE)

2023-07-01

978-1-6654-8494-7

ESSCIRC 2022 - IEEE 48th European Solid State Circuits Conference, Proceedings

48th IEEE European Solid State Circuits Conference, ESSCIRC 2022, 2022-09-19 → 2022-09-22, Milan, Italy

ESSCIRC 2022 - IEEE 48th European Solid State Circuits Conference, Proceedings

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Institutional Repository

conference paper

© 2022 G. Kiene, A.M. GUNAPUTI SREENIVASULU, R.W.J. Overwater, M. Babaie, F. Sebastiano