Optical constants of graphene measured by spectroscopic ellipsometry

Journal article (2010)
Department
QN/Quantum Nanoscience (AS) (TU Delft)
Copyright: American Institute of Physics
DOI: https://doi.org/doi:10.1063/1.3475393
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Published Date

31-08-2010

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Source:

Applied Physics Letters, 97 (9), 2010

Faculty

Applied Sciences

Department

QN/Quantum Nanoscience

Abstract

A mechanically exfoliated graphene flake ( ? 150×380??m2) on a silicon wafer with 98 nm silicon dioxide on top was scanned with a spectroscopic ellipsometer with a focused spot ( ? 100×55??m2) at an angle of 55°. The spectroscopic ellipsometric data were analyzed with an optical model in which the optical constants were parameterized by B-splines. This parameterization is the key for the simultaneous accurate determination of the optical constants in the wavelength range 210–1000 nm and the thickness of graphene, which was found to be 3.4 Å.

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