Print Email Facebook Twitter Electron wave front modulation with patterned mirrors Title Electron wave front modulation with patterned mirrors Author Krielaart, M.A.R. (TU Delft ImPhys/Microscopy Instrumentation & Techniques) Contributor Kruit, P. (promotor) Degree granting institution Delft University of Technology Date 2021-03-15 Abstract We propose a microscopy scheme for the controlled modulation of the electron wave front that utilizes patterned electron mirrors. The ability to control the wave front of the electron finds many applications in electron microscopy, for instance in contrast enhancement techniques, beam mode conversion, low-dose imaging techniques such as quantum electron microscopy (QEM) and multi-pass transmission electron microscopy (MP-TEM), or structural hypothesis testing. Subject Electron microscopyWave front modulationElectron mirrorAberration correctionElectron beam separator To reference this document use: https://doi.org/10.4233/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7 ISBN 978-94-6384-202-0 Part of collection Institutional Repository Document type doctoral thesis Rights © 2021 M.A.R. Krielaart Files PDF dissertation.pdf 22.13 MB Close viewer /islandora/object/uuid:285e9079-e12c-4cd4-9a34-555bf66237c7/datastream/OBJ/view