Print Email Facebook Twitter High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications Title High-reflection microprismatic material as a base for passive reference marks in machine vision metrology applications Author Trushkina, Anna V. (ITMO University) Vasilev, Aleksandr S. (ITMO University) Serikova, Mariya G. (ITMO University) Anisimov, A. (TU Delft Structural Integrity & Composites) Contributor Beyerer, J. (editor) Puente León, F. (editor) Date 2017-01-01 Subject Machine visionMark position estimationMicroprismatic retrore ective tapeReference markRetrore ectivity To reference this document use: http://resolver.tudelft.nl/uuid:36e1bda0-f5cf-48ea-a566-46098fd058c6 DOI https://doi.org/10.1117/12.2269426 Source Automated Visual Inspection and Machine Vision II, 10334 Part of collection Institutional Repository Document type conference paper Rights © 2017 Anna V. Trushkina, Aleksandr S. Vasilev, Mariya G. Serikova, A. Anisimov Files PDF 103340G.pdf 1.22 MB Close viewer /islandora/object/uuid:36e1bda0-f5cf-48ea-a566-46098fd058c6/datastream/OBJ/view