Print Email Facebook Twitter Terahertz near-field microspectroscopy Title Terahertz near-field microspectroscopy Author Knab, J.R. Adam, A.J.L. Chakkittakandy, R. Planken, P.C.M. Faculty Applied Sciences Department Imaging Science and Technology Date 2010-07-22 Abstract Using near-field, terahertz time-domain spectroscopy (THz-TDS), we investigate how the addition of a dielectric material into a subwavelength-diameter, cylindrical waveguide affects its transmission properties. The THz electric near-field is imaged with deep subwavelength resolution as it emerges from filled and unfilled waveguides. Spectroscopic data measured for waveguides filled with polycrystalline D-tartaric acid, and with polyethylene and silicon powders, illustrate the feasibility of this approach for obtaining spectroscopic information from a tiny sample volume. Subject circular waveguidesdielectric materialsdielectric waveguidesnear-field scanning optical microscopy To reference this document use: http://resolver.tudelft.nl/uuid:6f75add4-61ec-4bb9-9a88-f7681a10b236 DOI https://doi.org/10.1063/1.3467192 Publisher American Institute of Physics ISSN 0003-6951 Source http://link.aip.org/link/APPLAB/v97/i3/p031115/s1 Source Applied Physics Letters, 97 (3), 2010 Part of collection Institutional Repository Document type journal article Rights (c) 2010 The Author(s); American Institute of Physics Files PDF Knab_2010.pdf 547.61 KB Close viewer /islandora/object/uuid:6f75add4-61ec-4bb9-9a88-f7681a10b236/datastream/OBJ/view