Print Email Facebook Twitter 3D shape shearography with integrated structured light projection for strain inspection of curved objects Title 3D shape shearography with integrated structured light projection for strain inspection of curved objects Author Anisimov, A. Groves, R.M. Faculty Aerospace Engineering Department Aerospace Structures & Materials Date 2015-12-31 Abstract Shearography (speckle pattern shearing interferometry) is a non-destructive testing technique that provides full-field surface strain characterization. Although real-life objects especially in aerospace, transport or cultural heritage are not flat (e.g. aircraft leading edges or sculptures), their inspection with shearography is of interest for both hidden defect detection and material characterization. Accurate strain measuring of a highly curved or free form surface needs to be performed by combining inline object shape measuring and processing of shearography data in 3D. Previous research has not provided a general solution. This research is devoted to the practical questions of 3D shape shearography system development for surface strain characterization of curved objects. The complete procedure of calibration and data processing of a 3D shape shearography system with integrated structured light projector is presented. This includes an estimation of the actual shear distance and a sensitivity matrix correction within the system field of view. For the experimental part a 3D shape shearography system prototype was developed. It employs three spatially-distributed shearing cameras, with Michelson interferometers acting as the shearing devices, one illumination laser source and a structured light projector. The developed system performance was evaluated with a previously reported cylinder specimen (length 400 mm, external diameter 190 mmm) loaded by internal pressure. Further steps for the 3D shape shearography prototype and the technique development are also proposed. Subject 3D shearographyshape shearographymultiple viewing shearographystrain mappingstructured light projection To reference this document use: http://resolver.tudelft.nl/uuid:83cec40d-285c-437e-a7c8-01a200d9f6f5 Publisher SPIE ISBN 9781628416855 Source Proceedings of SPIE- International Society for Optical Engineering 9525: Optical Measurement Systems for Industrial Inspection IX, Munich, Germany, 22-25 June 2015 Part of collection Institutional Repository Document type conference paper Rights (c) 2015 SPIE Files PDF 319654.pdf 1000.05 KB Close viewer /islandora/object/uuid:83cec40d-285c-437e-a7c8-01a200d9f6f5/datastream/OBJ/view