Reliability Assessment and Test Methods for Anti-counterfeiting Technology

Title

Reliability Assessment and Test Methods for Anti-counterfeiting Technology

Author

Monteiro Oliveira Cortez, A.M.

Contributor

Bertels, K.L.M. (promotor)
Hamdioui, S. (promotor)

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics & Computer Engineering

Date

2015-11-04

Subject

hardware security
memory-based PUF systems
noise reduction
secure testing
scan-chain free testing
enhanced scan-chains

To reference this document use:

https://doi.org/10.4233/uuid:93f9d3af-38f7-45f4-ba62-e921c386f3c9

ISBN

978-94-6186-529-8

Part of collection

Institutional Repository

Document type

doctoral thesis

Rights

(c) 2015 Monteiro Oliveira Cortez, A.M.