Title
Resistive and CTAT Temperature Sensors in a Silicon Carbide CMOS Technology
Author
Romijn, J. (TU Delft Electronic Components, Technology and Materials) 
Middelburg, L.M. (TU Delft Electronic Components, Technology and Materials) 
Vollebregt, S. (TU Delft Electronic Components, Technology and Materials) 
el Mansouri, B. (TU Delft Electronic Components, Technology and Materials)
van Zeijl, H.W. (TU Delft Electronic Components, Technology and Materials)
May, Alexander (Fraunhofer Institute for Integrated Systems and Devices Technology IISB)
Erlbacher, Tobias (Fraunhofer Institute for Integrated Systems and Devices Technology IISB)
Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials) 
Sarro, Pasqualina M (TU Delft Electronic Components, Technology and Materials) 
Date
2021
Abstract
Accurately sensing the temperature in silicon carbide (power) devices is of great importance to their reliable operation. Here, temperature sensors by resistive and CMOS structures are fabricated and characterized in an open silicon carbide CMOS technology. Over a range of 25-200°C, doped design layers have negative temperature coefficients of resistance, with a maximum change of 79%. Secondly, CMOS devices are used to implement a CTAT, which achieves a maximum sensitivity of 7.5mV/K in a temperature range of 25-165°C. The integration of readout electronics and sensors that are capable of operation in higher temperature than silicon, opens application in harsher environments.
Subject
4H-SiC
SiC CMOS
silicon carbide
temperature sensor
wide bandgap semiconductors
To reference this document use:
http://resolver.tudelft.nl/uuid:941f20c2-7a0d-4aa6-b12b-57788d8ec7d3
DOI
https://doi.org/10.1109/SENSORS47087.2021.9639845
Publisher
IEEE, Piscataway
Embargo date
2022-06-17
ISBN
978-1-7281-9502-5
Source
2021 IEEE Sensors: Proceedings
Event
2021 IEEE Sensors, 2021-10-31 → 2021-11-03, Online at Sydney, Australia
Series
Proceedings of IEEE Sensors, 1930-0395, 2021-October
Bibliographical note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Part of collection
Institutional Repository
Document type
conference paper
Rights
© 2021 J. Romijn, L.M. Middelburg, S. Vollebregt, B. el Mansouri, H.W. van Zeijl, Alexander May, Tobias Erlbacher, Kouchi Zhang, Pasqualina M Sarro