Print Email Facebook Twitter Electrical characterization of PureB layers in contacts, diodes and transistors Title Electrical characterization of PureB layers in contacts, diodes and transistors Author Ramesh, S. Contributor Nanver, L.K. (mentor) Faculty Electrical Engineering, Mathematics and Computer Science Department Microelectronics Programme ECTM Date 2013-08-30 To reference this document use: http://resolver.tudelft.nl/uuid:a0616e4e-e433-4265-b5f6-4972bc06f01e Part of collection Student theses Document type master thesis Rights (c) 2013 Ramesh, S. Files PDF Sivaramakrishnan_Ramesh_M ... Thesis.pdf 1.83 MB Close viewer /islandora/object/uuid:a0616e4e-e433-4265-b5f6-4972bc06f01e/datastream/OBJ/view