Print Email Facebook Twitter Thermal Stability of MgyTi1-y Thin Films Investigated by Positron Annihilation Spectroscopy Title Thermal Stability of MgyTi1-y Thin Films Investigated by Positron Annihilation Spectroscopy Author Anastasopol, A. Eijt, S.W.H. Schut, H. Mulder, F.M. Plazaola, F. Dam, B. Faculty Applied Sciences Department RST/Radiation, Science and Technology Date 2012-12-31 Abstract Mg-Ti compounds are attractive candidates as hydrogen storage materials for their fast sorption kinetics and high storage capacity. In this context, an investigation of their thermal stability is of great importance. The thermal stability of MgyTi1-y thin films was investigated using positron annihilation spectroscopy. Despite the positive enthalpy of mixing of Mg and Ti, positron Doppler Broadening of Annihilation Radiation (DBAR) depth profiling showed that Mg0.9Ti0.1 films are stable up to 300°C. However, for Mg0.7Ti0.3 films, segregation of Mg and Ti was observed at 300oC by the appearance of a clear Ti signature in the S-W diagrams and in the Doppler broadening depth profiles analyzed using VEPFIT. The thickness of the 250-300 nm thin films remained unchanged during the heating treatments. We further present ab-initio calculations of positron lifetimes of the corresponding metal and metal hydride phases for comparison to our previous positron annihilation lifetime spectroscopy (PALS) study. Subject Mg-Ti alloysthin filmsDoppler broadening depth profilingpositron annihilation lifetime spectroscopyab-initio calculations To reference this document use: http://resolver.tudelft.nl/uuid:b6601e30-ddc9-4aea-b66e-6e7abdeec9b5 DOI https://doi.org/10.1016/j.phpro.2012.06.004 Publisher Elsevier ISSN 1875-3892 Source Physics Procedia, 35, 2012 Part of collection Institutional Repository Document type journal article Rights © 2012 The Author(s) Files PDF Anastasopol_2012.pdf 928.26 KB Close viewer /islandora/object/uuid:b6601e30-ddc9-4aea-b66e-6e7abdeec9b5/datastream/OBJ/view