Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips

Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips

Bagbaba, Ahmet Cagri (Cadence Design Systems; Tallinn University of Technology)
Augusto da Silva, F. (TU Delft Computer Engineering; Cadence Design Systems)
Sonza Reorda, Matteo (Politecnico di Torino)
Hamdioui, S. (TU Delft Quantum & Computer Engineering)
Jenihhin, Maksim (Tallinn University of Technology)
Sauer, Christian (Cadence Design Systems)

Quantum & Computer Engineering

2022

ISO 26262 requires classifying random hardware faults based on their effects (safe, detected, or undetected) within integrated circuits used in automobiles. In general, this classification is addressed using expert judgment and a combination of tools. However, the growth of integrated circuit complexity creates a huge fault space; hence, this form of fault classification is error prone and time consuming. Therefore, an automated and systematic approach is needed to target hardware fault classification in automotive systems on chips (SoCs), considering the application software. This work focuses on identifying safe faults: the proposed approach utilizes coverage analysis to identify candidate safe faults considering all the constraints coming from the application. Then, the behavior of the application software is modeled so that we can resort to a formal analysis tool. The proposed technique is evaluated on the AutoSoC benchmark running a cruise control application. Resorting to our approach, we could classify 20%, 11%, and 13% of all faults in the central processing unit (CPU), universal asynchronous receiver–transmitter (UART), and controller area network (CAN) as safe faults, respectively. We also show that this classification can increase the diagnostic coverage of software test libraries targeting the CPU and CAN modules by 4% to 6%, increasing the achieved testable fault coverage.

Automotive systems
Diagnostic coverage
Fault classification
Fault injection
Formal methods
Functional safety
ISO 26262
Safe faults

http://resolver.tudelft.nl/uuid:c3b1b05f-0abc-4484-993e-7ee78d966fca

https://doi.org/10.3390/electronics11030319

Electronics (Switzerland), 11 (3)

Institutional Repository

journal article

© 2022 Ahmet Cagri Bagbaba, F. Augusto da Silva, Matteo Sonza Reorda, S. Hamdioui, Maksim Jenihhin, Christian Sauer