Single emitter localization analysis in the presence of background

Conference paper (2015)

Authors

S. Stallinga

Department

ImPhys/Imaging Physics () (TU Delft)

Maximum likelihood estimation Single molecule Localization microscopy Cramer Rao lower bound Background

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Published Date

23-09-2015

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Source:

Optical Systems Design 2015: Computational Optics: Proceedings of SPIE- International Society for Optical Engineering; 9630

Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Abstract

Localization microscopy for imaging at the nano-scale relies on the quality of fitting the emitter positions from the measured light spots. The type and magnitude of the noise in the detection process, the background light level and the Point Spread Function model that is used in the fit are of paramount importance for the precision and accuracy of the fit. We present several developments on the computational methods and performance limits of single emitter localization, targeting specifically these three aspects.

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