On the Design and Analysis of Micro-metric Resolution Arrays in Integrated Technology for Near-Field Dielectric Spectroscopy

On the Design and Analysis of Micro-metric Resolution Arrays in Integrated Technology for Near-Field Dielectric Spectroscopy

Thippur Shivamurthy, H. (TU Delft Tera-Hertz Sensing)

Neto, A. (promotor)
Spirito, M. (promotor)

Delft University of Technology

2020-02-20

On the Design and Analysis of Micro-metric Resolution Arrays in Integrated Technology for Near-Field Dielectric Spectroscopy Medical procedures and treatments have a great impact on the quality of life as well as on the health care costs. Increasing number of cases pertaining to skin cancer have been documented by the International Agency for Research on Cancer (IARC) [80, 81] every year. The most commonly used surgical technique for the skin cancer treatment is the Mohs surgery, whereby thin layers of skin containing cancer tissue are removed until only cancer free tissue remains. Reducing the number of iterations and in turn the surgery time during a Mohs surgery [82] would reduce patient's discomfort and medical costs. Having a fast, accurate and non-invasive diagnostic tool for the detection of anomalies would provide an additional assistance during the Moh's surgery to assess the depth of the tissue removal resulting in few iterations. On the other hand, horticulture sector represent a very large market in several parts of the world. Enabling techniques to better assess the quality of the product during the entire supply chain process would result in high quality deliverables. Moreover, characterization of materials/objects with high accuracy is applicable to other scenarios that can be addressed by dielectric spectroscopy (e.g., surface quality inspection), which plays a role in many fabrication processes. To address these needs, this work targets at developing models based on spectral method of moments to characterize multilayered samples for two near-_eld systems, _rst that of an open-ended coaxial probe and second, a matrix of near-_eld permittivity sensors in integrated technology.

Capacitive Sensors
Coaxial Probes
Sensitivity
Pin-Patch elements
Method of Moments
Greens function
CMOS Technology

https://doi.org/10.4233/uuid:cebc3c19-40b1-4b6d-8acd-e30cbd6f0fda

978-94-6384-114-6

Institutional Repository

doctoral thesis

© 2020 H. Thippur Shivamurthy