Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces

Title

Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces

Author

De Jong, A.F.

Contributor

Van der Mast, K.D. (promotor)
Van Dyck, D. (promotor)

Faculty

Applied Sciences

Date

1990-06-18

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http://resolver.tudelft.nl/uuid:fbd7d15e-bce8-428e-a02d-034d623f2518

Part of collection

Institutional Repository

Document type

doctoral thesis

Rights

(c) 1990 A.F. de Jong