Title
Is RISC-V ready for Space? A Security Perspective
Author
Cassano, Luca (Politecnico di Milano)
Di Mascio, S. (TU Delft Space Systems Egineering) 
Palumbo, Alessandro (University of Rome Tor Vergata)
Menicucci, A. (TU Delft Space Systems Egineering) 
Furano, Gianluca (European Space Agency (ESA))
Bianchi, Giuseppe (University of Rome Tor Vergata)
Ottavi, Marco (University of Rome Tor Vergata; University of Twente)
Contributor
Cassano, Luca (editor)
Chakravarty, Sreejit (editor)
Bosio, Alberto (editor)
Date
2022
Abstract
Integrated circuits employed in space applications generally have very low-volume production and high performance requirements. Therefore, the adoption of Commercial-Off-The-Shelf (COTS) components and Third Party Intellectual Property cores (3PIPs) is of extreme interest to make system design, implementation and deployment cost-effective and viable w.r.t. performance. On the other hand, this design paradigm exposes the system to a number of security threats both at design-time and at runtime. In this paper, we discuss the security issues related to space applications mainly focusing on threats that come from the adoption of the well-known RISCV microprocessor. We highlight how Hardware Trojan horses (HTHs) and Microarchitectural Side-Channel Attacks (MSCAs) may compromise the overall system operation by either altering its nominal behavior or by stealing secret information. We discuss the security extensions provided by the RISC-V architecture as well as their limitations. The paper is concluded by an overview of the issues that are still open regarding the security of such microprocessor in the space domain.
Subject
Hardware Security
Hardware Trojan Horses
Microarchitectural Side-Channel Attacks
Microprocessors
RISC-V
Space Applications.
To reference this document use:
http://resolver.tudelft.nl/uuid:b071b6f0-7888-4f74-ac56-9864f457886f
DOI
https://doi.org/10.1109/DFT56152.2022.9962352
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Embargo date
2023-07-01
ISBN
9781665459389
Source
Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022
Event
35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, 2022-10-19 → 2022-10-21, Austin, United States
Series
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, 2576-1501, 2022-October
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Part of collection
Institutional Repository
Document type
conference paper
Rights
© 2022 Luca Cassano, S. Di Mascio, Alessandro Palumbo, A. Menicucci, Gianluca Furano, Giuseppe Bianchi, Marco Ottavi