Title
On the Analysis of Real-time Operating System Reliability in Embedded Systems
Author
Mamone, Dario (Politecnico di Torino)
Bosio, Alberto (École Centrale de Lyon)
Savino, Alessandro (Politecnico di Torino)
Hamdioui, S. (TU Delft Quantum & Computer Engineering) 
Rebaudengo, Maurizio (Politecnico di Torino)
Contributor
Dilillo, Luigi (editor)
Psarakis, Mihalis (editor)
Siddiqua, Taniya (editor)
Department
Quantum & Computer Engineering
Date
2020
Abstract
Nowadays, the reliability has become one of the main issues for safety-critical embedded systems, like automotive, aerospace and avionic. In an embedded system, the full system stack usually includes, between the hardware layer and the software/application layer, a middle layer composed by the Operating System (OS) and the middleware. Most of the time, in the literature only the application-layer is considered during the reliability analysis. This is due to the fact that middle layer short execution time makes the probability of a fault affecting it much lower compared to the application-level. Nevertheless, middle layer data structures lifespan is equivalent to the application layer ones. Moreover, all the times a hardware fault propagates to the middle-layer as an error, and especially to the OS, its impact can be expected to be potentially catastrophic. The aim of this work is to study the reliability of a Real-Time Operating System (RTOS) affected by Single Event Upset (SEU) faults. The methodology targets the most relevant variables and data structures of FreeRTOS analyzed through a software-based fault injection. Results show the ability to highlight the criticality in the OS fault tolerance, in terms of system integrity, data integrity and the overall inherent resiliency to faults, potentially leading to selective hardening of the OS.
Subject
Embedded Systems
Real-Time Operating System
Fault Injection
Reliability
To reference this document use:
http://resolver.tudelft.nl/uuid:cedaed71-6418-43eb-9acd-f4d431f9ff77
DOI
https://doi.org/10.1109/DFT50435.2020.9250861
Publisher
IEEE
ISBN
978-1-7281-9458-5
Source
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings
Event
2020 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020-10-19 → 2020-10-21, On-line Virtual Event
Series
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020
Bibliographical note
Accepted author manuscript
Part of collection
Institutional Repository
Document type
conference paper
Rights
© 2020 Dario Mamone, Alberto Bosio, Alessandro Savino, S. Hamdioui, Maurizio Rebaudengo