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document
de Laat, M.L.C. (author), Perez Garza, H.H. (author), Ghatkesar, M.K. (author)
The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust the stiffness in situ of a commercial AFM...
journal article 2016
document
Van Oorschot, R. (author), Perez Garza, H.H. (author), Derks, R.J.S. (author), Staufer, U. (author), Ghatkesar, M.K. (author)
We present the development of a microfluidic AFM (atomic force microscope) cantilever-based platform to enable the local dispensing and aspiration of liquid with volumes in the pico-to-femtoliter range. The platform consists of a basic AFM measurement system, microfluidic AFM chip, fluidic interface, automated substrate alignment, external...
journal article 2015