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document
Zandbergen, H.W. (author), Ahn, C.W. (author)
A method for sample preparation for cryoelectron microscopy (CEM), wherein the sample is held in a microreactor, wherein the conditions in the microreactor are regulated relative to the environment, wherein the sample in the microreactor is frozen according to a quench freeze process, whereupon the sample, in frozen condition, is placed in the...
patent 2008
document
Zandbergen, H.W. (author)
The present invention is in the field of a low specimen drift holder and cooler for use in microscopy, and a microscope comprising said holder. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam mi- croscopy (EM and FIB). However it application is extendable in principle to any field...
patent 2015
document
Storm, A.J. (author), Zandbergen, H.W. (author)
The invention relates to a method for manufacturing nanometer-scale apertures, wherein, in an object, in a conventional manner, at least one aperture is provided with a nanometer-scale surface area, after which, by means of an electron beam, energy is supplied to at least the edge of said at least one aperture, such that the surface area of the...
patent 2004
document
Zandbergen, H.W. (author), Pleun, D. (author), Van Veen, G.N.A. (author)
The invention relates to a holder assembly for cooperating with an environmental cell ( 101 ) and an electron microscope, the environmental cell showing a fluid inlet (103), the electron microscope showing a vacuum wall (110) for separating an evacuable part of the electron microscope from the outside of the electron microscope, the holder...
patent 2013
document
Zandbergen, H.W. (author)
The present invention is in the field of a transferrable system for use in in-situ experiments in a microscope and spectrometer, use of said transferrable system, and a microscope or spectrometer comprising said transferrable system, wherein the microscope is selected from an electron microscope, an IR-microscope, a Raman-microscope, X-ray micro...
patent 2015
document
Xu, Q. (author), Schneider, G. (author), Zandbergen, H.W. (author), Wu, M.Y. (author), Song, B. (author)
The present invention is in the field of a method for removing a high definition nanostructure in a partly free-standing layer, the layer, a sensor comprising said layer, a use of said sensor, and a method of detecting a species, and optional further characteristics thereof, using said sensor. The sensor and method are suited for detecting...
patent 2013
document
Zandbergen, H.W. (author)
patent 2008
document
Zandbergen, H.W. (author)
Abstract of NL 9402226 (A) The invention relates to an arrangement for accommodating a sample in an electron microscope, equipped with a sample holder which comprises sample accommodation means and is designed for at least partial accommodation in an electron microscope, where at least one sample mount is provided which can contain a sample in a...
patent 1996
document
Creemer, J.F. (author), Zandbergen, H.W. (author), Sarro, P.M. (author)
A microreactor for use in a microscope, comprising a first and second cove layer (13) , which cover layers are both at least partly transparent to an electron beam (14) of an electron microscope, and extend next to each other at a mutual distance from each other and between which a chamber (15) is enclosed, wherein an inlet (4) and an outlet (5)...
patent 2006
document
Latenstein Van Voorst, A. (author), Westra, C. (author), Hoveling, G.H. (author), Zandbergen, H.W. (author)
Abstract of NL 9402241 (A) Sample holder for an electron microscope provided with a rod-shaped body which near a first end is provided with means for accommodating a sample, means being present for at least temporarily airtightly and moisture-tightly shielding the sample against the environment in a first position. Said shielding means comprise...
patent 1996
document
Zandbergen, H.W. (author), Tichelaar, F.D. (author), Alkemade, P.F.A. (author)
A method for the formation of nanometer-scale electrodes, wherein strip of electrically conductive material, in particular metal, is provided with a longitudinal direction, a width direction and a thickness direction and then, with the aid of an electron beam, a groove is provided in a top surface of the strip, in the width direction of the...
patent 2006
document
Zandbergen, H.W. (author), Latenstein van Voorst, A. (author), Westra, C. (author), Hoveling, G.H. (author)
A specimen holder for an electron microscope, comprising a bar-shaped body provided adjacent one end with means for receiving a specimen, with means being present for screening the specimen from the environment at least temporarily in airtight and moisture-proof manner in a first position, which screening means comprise at least one elastic seal...
patent 1996
document
Zandbergen, H.W. (author)
A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control...
patent 2004
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