Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism

Test data travels through a System on Chip (SOC) from the chip pins to the Core-Under-Test (CUT) and vice versa via a Test Access Mechanism (TAM). Conventionally, a TAM is implemented using dedicated communication infrastructure. However, also existing functional interconnect, such as a bus or Network on Chip (NOC), can be reused as TAM; this...