Deposition and atomic force microscopy of individual phthalocyanine polymers between nanofabricated electrodes

Nanofabrication of electrodes with sub-5 nm spacing for transport experiments on single molecules and metal clusters

Electron-beam-induced deformations of SiO2 nanostructures

The imaging beam of a transmission electron microscope can be used to fine tune critical dimensions in silicon oxide nanostructures. This technique is particularly useful for the fabrication of nanopores with single-nanometer precision, down to 2 nm. We report a detailed study on the effect of electron-beam irradiation on apertures with various...