Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy

We have observed the distribution of electron trapping centers on distorted carbon nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial selectivities. This technique involves the use of scanning probe microscopy (SPM) under synchrotron radiation excitation of the inner shell of carbon. The probe detects the...

Magnetic properties of electroplated nano/microgranular NiFe thin films for rf application

A granular NiFe thin film with large in-plane magnetic anisotropy and high ferromagnetic-resonance frequency developed for radio-frequency integrated circuit (IC) applications is presented. During the deposition, three-dimensional (3D) growth occurs, yielding NiFe grains (? ? 1.0??m). Nanonuclei (? ? 30–50?nm) are observed in single NiFe grains...

Deposition and atomic force microscopy of individual phthalocyanine polymers between nanofabricated electrodes