"uuid","repository link","title","author","contributor","publication year","abstract","subject topic","language","publication type","publisher","isbn","issn","patent","patent status","bibliographic note","access restriction","embargo date","faculty","department","research group","programme","project","coordinates" "uuid:c7a76411-e32d-4dcc-8515-4ab57098f293","http://resolver.tudelft.nl/uuid:c7a76411-e32d-4dcc-8515-4ab57098f293","Length control of individual carbon nanotubes by nanostructuring with a scanning tunneling microscope","Venema, L.C.; Wildoer, J.W.G.; Tuinstra, H.L.J.T.; Dekker, C.; Rinzler, A.G.; Smalley, R.E.","","1997","","A6146 Structure of solid clusters, nanoparticles, and nanostructured materials; A6820 Solid surface structure; C; carbon; carbon nanotube; carbon nanotubes; Current voltage curves; electronic properties; imaging; individual C nanotubes; INSPEC; length control; nanostructured materials; nanostructuring; nanotubes; quantum size effect; quantum size effects; scanning tunneling microscope; scanning tunneling microscopy; scanning tunnelling microscopy; size effect; stepwise current increase; STM; STM spectroscopy; surface topography; topographic imaging","en","journal article","AIP","","","","","","","","","","","","",""