"uuid","repository link","title","author","contributor","publication year","abstract","subject topic","language","publication type","publisher","isbn","issn","patent","patent status","bibliographic note","access restriction","embargo date","faculty","department","research group","programme","project","coordinates" "uuid:e6cedfe5-c16c-476b-a377-7194db11054f","http://resolver.tudelft.nl/uuid:e6cedfe5-c16c-476b-a377-7194db11054f","Low-frequency noise in quantum point contacts","Liefrink, F.; Scholten, A.J.; Dekker, C.; Dijkhuis, J.I.; Eppenga, R.; Van Houten, H.; Foxon, C.T.","","1992","","A7270 Noise processes and phenomena in electronic transport; A7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctions; aluminium compounds; B2530B Semiconductor junctions; electron traps; electrostatic potential; fluctuations; GaAs Al sub x Ga sub 1 x As; gallium arsenide; III V semiconductors; INSPEC; low frequency noise; noise; point contacts; quantum point contact; quantum point contacts; resistance; resistance noise; single electron trap; trapped electron","en","conference paper","IOS Press","","","","","","","","","","","","",""