"uuid","repository link","title","author","contributor","publication year","abstract","subject topic","language","publication type","publisher","isbn","issn","patent","patent status","bibliographic note","access restriction","embargo date","faculty","department","research group","programme","project","coordinates" "uuid:06a694bc-6bdc-4bf3-9014-8eeac94a7623","http://resolver.tudelft.nl/uuid:06a694bc-6bdc-4bf3-9014-8eeac94a7623","Spontaneous resistance switching and low-frequency noise in quantum point contacts","Dekker, C.; Scholten, A.J.; Liefrink, F.; Eppenga, R.; Van Houten, H.; Foxon, C.T.","","1991","","A7220J Charge carriers: generation, recombination, lifetime, and trapping semiconductors/insulators; A7270 Noise processes and phenomena in electronic transport; A7320D Electron states in low dimensional structures; A7340L Electrical properties of semiconductor to semiconductor contacts, p n junctions, and heterojunctions; carrier mobility; charge transport; conductance; electron device noise; electron traps; electrostatic potential; frequency dependence; INSPEC; local electrostatic potential; low frequency noise; low frequency noise spectroscopy; model; noise; point contacts; quantum point contact; quantum point contacts; quantum size effect; resistance; resistance switching; semiconductor quantum dots; semiconductors; size effect; spectral density; temperature dependence; transport; trapping; white noise","en","journal article","","","","","","","","","","","","","",""