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Far-infrared picosecond time-resolved measurement of the free-induction decay in GaAs:Si

Planken, P.C.M. (author), van Son, P.C. (author), Hovenier, J.N. (author), Klaassen, T.O. (author), Wenckebach, W.Th. (author), Murdin, B.N. (author), Knippels, G.M.H. (author)

journal article 1995