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Hofhuis, J. (author), Schoonman, J. (author), Goossens, A. (author)
Time-of-Flight (TOF) measurements have been performed on n-type TiO2/p-type CuInS2 heterojunctions. The TiO2 film thickness has been varied between 200 and 400 nm, while the CuInS2 film thickness has been fixed at 500 nm. The TOF response can be accurately modeled, if the potential drop across the p-n heterojunction with a large density of...
journal article 2008
Savenije, T.J. (author), Nanu, M. (author), Schoonman, J. (author), Goossens, A. (author)
Photoinduced interfacial charge carrier generation, separation, trapping, and recombination in TiO2?In2S3?CuInS2 cells have been studied with time-resolved microwave conductivity (TRMC). Single layer, double layer, and complete triple layer configurations have been studied. Selective electronic excitation in one of the components is accomplished...
journal article 2007
Nanu, M. (author), Boulch, F. (author), Schoonman, J. (author), Goossens, A. (author)
Deep-level transient spectroscopy (DLTS) has been used to measure the concentration and energy position of deep electronic states in CuInS2. Flat TiO2?CuInS2 heterojunctions as well as TiO2-CuInS2 nanocomposites have been investigated. Subband-gap electronic states in CuInS2 films are mostly due to antisite point defects and vacancies....
journal article 2005