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Wu, J. (author), Petrov, R.H. (author), Kölling, S. (author), Godet, Stephane (author), Sietsma, J. (author)
Micro- to nano-scale characterization of the microstructures in the white etching layer (WEL), observed in a Dutch R260 Mn grade rail steel, was performed via various techniques. Retained austenite in the WEL was identified via electron backscatter diffraction (EBSD), automatic crystallographic orientation mapping in transmission electron...
journal article 2018