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Weppelman, I.G.C. (author), Moerland, R.J. (author), Zhang, L (author), Kieft, E. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the source. We have recently presented the concept...
journal article 2019