Searched for:
(1 - 1 of 1)
Hofhuis, J. (author), Schoonman, J. (author), Goossens, A. (author)
Time-of-Flight (TOF) measurements have been performed on n-type TiO2/p-type CuInS2 heterojunctions. The TiO2 film thickness has been varied between 200 and 400 nm, while the CuInS2 film thickness has been fixed at 500 nm. The TOF response can be accurately modeled, if the potential drop across the p-n heterojunction with a large density of...
journal article 2008