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Zhong, Zhichao (author), Aveyard, R.A. (author), Rieger, B. (author), Bals, Sara (author), Palenstijn, Willem Jan (author), Batenburg, K. Joost (author)
HAADF-STEM tomography is a common technique for characterizing the three-dimensional morphology of nanomaterials. In conventional tomographic reconstruction algorithms, the image intensity is assumed to be a linear projection of a physical property of the specimen. However, this assumption of linearity is not completely valid due to the...
journal article 2018