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Voortman, L.M. (author), Stallinga, S. (author), Schoenmakers, R.H.M. (author), Van Vliet, L.J. (author), Rieger, B. (author)
Today, the resolution in phase-contrast cryo-electron tomography is for a significant part limited by the contrast transfer function (CTF) of the microscope. The CTF is a function of defocus and thus varies spatially as a result of the tilting of the specimen and the finite specimen thickness. Models that include spatial dependencies have not...
journal article 2011
Vulovic, M. (author), Franken, E. (author), Ravelli, R.B.G. (author), Van Vliet, L.J. (author), Rieger, B. (author)
Defocus and twofold astigmatism are the key parameters governing the contrast transfer function (CTF) in transmission electron microscopy (TEM) of weak phase objects. We present a new algorithm to estimate these aberrations and the associated uncertainties. Tests show very good agreement between simulated and estimated defocus and astigmatism....
journal article 2012