Searched for:
(1 - 1 of 1)
document
Wu, C. (author), Van der Have, F. (author), Vastenhouw, B. (author), Dierckx, R.A.J.O. (author), Paans, A.M.J. (author), Beekman, F.J. (author)
Purpose: In pinhole SPECT, attenuation of the photon flux on trajectories between source and pinholes affects quantitative accuracy of reconstructed images. Previously we introduced iterative methods that compensate for image degrading effects of detector and pinhole blurring, pinhole sensitivity and scatter for multi-pinhole SPECT. The aim of...
journal article 2010