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Enabling aberration retrieval of microlenses with the Extended Nijboer-Zernike (ENZ) diffraction theory
Enabling aberration retrieval of microlenses with the Extended Nijboer-Zernike (ENZ) diffraction theory
General imaging of advanced 3D mask objects based on the fully-vectorial Extended Nijboer-Zernike (ENZ) theory
General imaging of advanced 3D mask objects based on the fully-vectorial Extended Nijboer-Zernike (ENZ) theory
Extended Nijboer-Zernike (ENZ) based mask imaging: Efficient coupling of electromagnetic field solvers and the ENZ imaging algorithm
Extended Nijboer-Zernike (ENZ) based mask imaging: Efficient coupling of electromagnetic field solvers and the ENZ imaging algorithm
Vectorial analysis of polarization issues in multi-axial nulling interferometers for exoplanet detection
Vectorial analysis of polarization issues in multi-axial nulling interferometers for exoplanet detection
Design of a polarization nulling interferometer for exoplanet detection
Design of a polarization nulling interferometer for exoplanet detection
Development of a liquid based deformable mirror
Development of a liquid based deformable mirror
Nulling interferometry for exoplanet detection using polarization properties
Nulling interferometry for exoplanet detection using polarization properties
Nulling interferometry without achromatic phase shifters: Latest results
Nulling interferometry without achromatic phase shifters: Latest results
Aerial image based lens metrology for wafer steppers
Aerial image based lens metrology for wafer steppers
Comparison of blind imaging performance of Fizeau and Michelson type arrays for a partially resolved object
Comparison of blind imaging performance of Fizeau and Michelson type arrays for a partially resolved object
A deformable mirror based on electrocapillary actuation of a liquid surface
A deformable mirror based on electrocapillary actuation of a liquid surface
Absolute distance metrology for space interferometers
Absolute distance metrology for space interferometers
Measurements from a novel interferometer for EUVL mirror substrates
Measurements from a novel interferometer for EUVL mirror substrates
Aberration retrieval for high-NA optical systems using the Extended Nijboer-Zernike theory
Aberration retrieval for high-NA optical systems using the Extended Nijboer-Zernike theory
Correction of the phase retardation caused by intrinsic birefringence in deep UV lithography
Correction of the phase retardation caused by intrinsic birefringence in deep UV lithography
Reusable holographic velocimetry system based on polarization multiplexing in Bacteriorhodopsin
Reusable holographic velocimetry system based on polarization multiplexing in Bacteriorhodopsin
Experimental performance of homothetic mapping for wide field interferometric imaging
Experimental performance of homothetic mapping for wide field interferometric imaging
Experimental verification of field extension for non-homothetic arrays with a pupil-plane interferometer
Experimental verification of field extension for non-homothetic arrays with a pupil-plane interferometer
Demonstration of nulling using delay line phase shifters
Demonstration of nulling using delay line phase shifters
Avoiding unstable regions in the design space of EUV mirror systems comprising high-order aspheric surfaces
Avoiding unstable regions in the design space of EUV mirror systems comprising high-order aspheric surfaces
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