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Chen, Peng (author), Huang, Xiongchuan (author), Chen, Y. (author), Wu, Lianbo (author), Staszewski, R.B. (author)
To characterize an on-chip programmable delay in a low-cost and high-resolution manner, a built-in self-test based on a first-order ΔΣ time-to-digital converter with self-calibration is proposed and implemented in TSMC 28-nm CMOS. The system is self-contained, and only one digital clock is needed for the measurements. A...
journal article 2018