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Yazdan Mehr, M. (author), Van Driel, W.D. (author), Zhang, G.Q. (author)
A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also...
journal article 2015