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Yazdan Mehr, M. (author), van Driel, W.D. (author), De Buyl, Francois (author), Zhang, Kouchi (author)
Degradation mechanisms of silicone plates under harsh environment conditions are studied in this investigation. Environmental degradation of silicone free form, used as secondary optics in Light Emitting Diode LED lighting lamps and luminaires or any other applications requiring high quality optics being used, has negative implications for the...
journal article 2018
document
Yazdan Mehr, M. (author), Toroghinejad, M.R. (author), Karimzadeh, F. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Reduction of intensity of light output is one of the most common degradation modes in light-emitting diode (LED) systems. It starts from the failure of the various components in the system, including the chip, the driver, and optical components (i.e. phosphorous layer). The kinetics of degradation in real life applications is relatively slow...
journal article 2018
document
Sun, B. (author), Fan, Xuejun (author), Ye, H. (author), Fan, Jiajie (author), Qian, Cheng (author), van Driel, W.D. (author), Zhang, Kouchi (author)
In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver's degradations on lamp's lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp's...
journal article 2017
document
Yazdan Mehr, M. (author), Van Driel, W.D. (author), Zhang, G.Q. (author)
A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also...
journal article 2015
document
Yazdan Mehr, M. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also...
journal article 2015
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