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document
Kruit, P. (author)
The invention relates to an apparatus and method for inspecting a sample. The apparatus comprises a generator for generating an array of primary charged particle beams (33), and a charged particle optical system with an optical axis (38). The optical system comprises a first lens system (37, 310) for focusing all primary beams (33) into a first...
patent 2014
document
Kruit, P. (author), Gheidari, A.M. (author), Ren, Y. (author)
The invention relates to an apparatus for inspecting a surface of a sample, wherein the apparatus comprises : at least one charged particle source for generating an array of primary charged particle beams, a condenser lens for directing all charged particle beams to a common cross-over, a lens system for directing the primary charged particle...
patent 2013
document
Hoogenboom, J.P. (author), Kruit, P. (author), Zonnevylle, A.C. (author)
The invention relates to an apparatus for inspecting a sample, equipped with a charged particle column for producing a focused beam of charged particles to observe or modify the sample, and an optical microscope to observe a region of interest on the sample as is observed by the charged particle beam or vice versa, the apparatus accommodated...
patent 2013
document
Kruit, P. (author), Hoogenboom, J.P. (author), Zonnevylle, A.C. (author)
An inspection apparatus is provided comprising in combination at least an optical microscope and an ion- or electron microscope equipped with a source for emitting a primary beam of radiation to a sample in a sample holder. The apparatus may comprise a detector for detection of secondary radiation backscattered from the sample and induced by the...
patent 2012
document
Kruit, P. (author), Van Overbeek, F. (author), Gravendeel, B. (author)
The invention relates to a railway infrastructure for a tram- or train transport system, comprising rails and an overhead contact line for providing the tram or train movable over the rails with an electrical drive power, which overhead contact line comprises overhead contact line sections connected to each other, each of which are individually...
patent 2009
document
Kruit, P. (author), Van Overbeeke, F. (author), Gravendeel, B. (author)
Abstract of corresponding document: EP 2017118 (A1) The invention relates to a railway infrastructure for a tram- or train transport system, comprising rails and an overhead contact line for providing the tram or train movable over the rails with an electrical drive power, which overhead contact line comprises overhead contact line sections...
patent 2009
document
Van Someren, B. (author), Kruit, P. (author)
The invention relates to a method for forming an image of a beam source that during operation provides a beam, and wherein the beam is split so as to divide the beam into beamlets, wherein a redirecting organ is used with which each individual beamlet is redirected to a predetermined degree with the extent of redirection of each beamlet by means...
patent 2008
document
Kruit, P. (author), Ferreira, J.A. (author)
The invention relates to compensation device for a magnetic field generated through electric traction in a tram or train transport system that comprises an overhead line and rails, the overhead line and rails during operation being live, wherein a predetermined section of the overhead line and rails is provided with adjacent circuits, each of...
patent 2007
document
Kruit, P. (author), Van Bruggen, M.J. (author)
patent 2006
document
Kruit, P. (author)
The invention relates to a scanning transmission electron microscope comprising an electron source, an electron accelerator and deflection means for directing electrons emitted by the electron source at an object to be examined, and in addition a detector for detecting electrons coming from the object and, connected to the detector, a device for...
patent 2006
document
Kruit, P. (author), Hagen, C.W. (author), Mulder, E.H. (author)
The invention relates 'to a micro X-ray source comprising a target acting as anode, and a cathode, which during operation interacts with the target and functions as electron source, wherein the target is embodied as a metal foil possessing a spot where the electrons from the electron source arrive, the metal foil being locally thinner at the spot.
patent 2006
document
Kruit, P. (author), Van Aken, R.H. (author)
An electron optical device for, in use, creating negative spherical and chromatic aberration and reducing the energy spread in an electron beam travelling on an optical axis, including: at least one conducting plate substantially perpendicular to the optical axis with a first aperture having a first radius around said optical axis, a thin foil...
patent 2004
document
Wieland, M.J.J. (author), Kampherbeek, B.J. (author), Kruit, P. (author)
An electron source provided with a substrate layer (17) and a semiconductor layer (16) with at least one tip (19), the substrate layer (17) being suitable for receiving light of a first wavelength and transmitting the light to the semiconductor layer (16) that is suitable to convert the light into electrons by a photo-electric effect, the...
patent 2002
document
Kruit, P. (author), Mook, H.W. (author)
An electron microscope provided with an electron source; an energy-dispersive element; an accelerating tube; a plate mounted between the energy-dispersive element and the specimen, in which a selection slit is provided at right angles to the dispersive direction of the dispersive element; source imaging electron optics for obtaining an image of...
patent 2000
document
Kruit, P. (author)
Lithography system comprising a light source producing a light beam directed to a mask (3) located in a mask level and an optical demagnifier (4-6) for demagnifying by a factor and focusing the beam. The light beam is focused on a converter element (8) for converting said beam in a further beam having a smaller wavelength than UV light. The beam...
patent 1998
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