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Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states
Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductors
Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers
Photoemission sources and beam blankers for ultrafast electron microscopy
Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker
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