Searched for: +
(1 - 2 of 2)
document
Ellis, J.D. (author), Meskers, A.J.H. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
Displacement interferometry is widely used for accurately characterizing nanometer and subnanometer displacements in many applications. In many modern systems, fiber delivery is desired to limit optical alignment and remove heat sources from the system, but fiber delivery can exacerbate common interferometric measurement problems, such as...
journal article 2011
document
Joo, K.N. (author), Ellis, J.D. (author), Spronck, J.W. (author), Van Kan, P.J.M. (author), Munnig Schmidt, R.H. (author)
We describe a simple heterodyne laser interferometer that has subnanometer periodic errors and is applicable to industrial fields. Two spatially separated beams can reduce the periodic errors, and the use of a right-angle prism makes the optical configuration much simpler than previous interferometers. Moreover, the optical resolution can be...
journal article 2009