An On-Chip Self-Characterization of a Digital-to-Time Converter by Embedding it in a First-Order ΔΣ Loop

To characterize an on-chip programmable delay in a low-cost and high-resolution manner, a built-in self-test based on a first-order ΔΣ time-to-digital converter with self-calibration is proposed and implemented in TSMC 28-nm CMOS. The system is self-contained, and only one digital clock is needed for the measurements. A...

An All-Digital PLL for Cellular Mobile Phones in 28-nm CMOS with -55 dBc Fractional and -91 dBc Reference Spurs

We propose a time-predictive architecture of an all-digital PLL (ADPLL) for cellular radios, which is optimized for advanced CMOS. It is based on a 1/8-length time-to-digital converter (TDC) of stabilized 7-ps resolution, as well as wide tuning range, and fine-resolution class-F digitally controlled oscillator (DCO) with only switchable metal...