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Sun, B. (author), Fan, Xuejun (author), Fan, J. (author), Zhang, Kouchi (author), Qian, Cheng (author)
In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation...
conference paper 2017