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Liu, C. (author), Malladi, S.R.K. (author), Xu, Q. (author), Chen, Jianghua (author), Tichelaar, F.D. (author), Zhuge, Xiaodong (author), Zandbergen, H.W. (author)
Age-hardening in Al alloys has been used for over a century to improve its mechanical properties. However, the lack of direct observation limits our understanding of the dynamic nature of the evolution of nanoprecipitates during age-hardening. Using in-situ (scanning) transmission electron microscopy (S/TEM) while heating an Al-Cu alloy, we...
journal article 2017
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Van Veldhoven, E. (author), Sidorkin, V. (author), Chen, P. (author), Alkemade, P. (author), Van der Drift, E. (author), Salemink, H. (author), Zandbergen, H. (author), Maas, D. (author)
journal article 2010
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Van Huis, M.A. (author), Sluiter, M.H.F. (author), Chen, J.H. (author), Zandbergen, H.W. (author)
journal article 2007
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Storm, A.J. (author), Chen, J.H. (author), Ling, X.S. (author), Zandbergen, H.W. (author), Dekker, C. (author)
The imaging beam of a transmission electron microscope can be used to fine tune critical dimensions in silicon oxide nanostructures. This technique is particularly useful for the fabrication of nanopores with single-nanometer precision, down to 2 nm. We report a detailed study on the effect of electron-beam irradiation on apertures with various...
journal article 2005
document
Storm, A.J. (author), Chen, J.H. (author), Zandbergen, H.W. (author), Dekker, C. (author)
journal article 2005
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