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Lazar, S. (author), Weyher, J.L. (author), Macht, L. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author)Photochemical (PEC) etching and transmission electron microscopy (TEM) have been used to study the defects in hetero-epitaxial GaN layers. TEM proved that PEC etching reveals not only dislocations but also nanopipes in the form of protruding, whisker-like etch features. It is shown by diffraction contrast techniques that the nanopipes are screw...journal article 2004