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Rudneva, M. (author), Gao, B. (author), Prins, F. (author), Xu, Q. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)
In situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control,...
journal article 2013
document
Heersche, H.B. (author), Lientschnig, G. (author), O'Neill, K. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)
The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of...
journal article 2007
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Mantel, O.C. (author), Van der Zant, H.S.J. (author), Steinfort, A.J. (author), Dekker, C. (author), Traeholt, C. (author), Zandbergen, H.W. (author)
journal article 1997