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Rudneva, M. (author), Kozlova, T. (author), Zandbergen, H.W. (author)Scanning transmission electron microscopy (STEM) imaging is applied to analyze the electromigration-induced thickness variations of thin polycrystalline films, It is shown that a high angle annular dark field (HAADF) detector is required to minimize the effect of diffraction contact. A further reduction of the diffraction contrast can be...journal article 2014
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Kozlova, T. (author), Rudneva, M. (author), Zandbergen, H.W. (author)We investigated the reversible electromigration in Pd–Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3–5 × 107 A cm?2), material transport occurs from the cathode towards the anode...journal article 2013